Title |
Electrical Conduction Characteristics of XLPE Film evaporated Different Metal Electrode |
Authors |
이흥규(Lee, Heung-Gyu) ; 이운영(Lee, Un-Yeong) ; 임기조(Im, Gi-Jo) ; 김용주(Kim, Yong-Ju) |
Keywords |
전기전도 ; 계면현상 ; 공간전하제한전류 ; 금속-절연체-금속 계면 ; 임계전계 ; 트랩충만전계 Electrical conduction ; Interfacial phenomena ; SCLC ; MIM Interfaces ; Critical electric field ; Trap filled electric field |
Abstract |
Electrical conduction characteristics of XLPE film evaporated with different metal electrode are discussed. The relation between electrical current(I) and Voltage(V) in the M(metal)-I(XLPE)-M(metal) structure are measured in the temperature range from 25[°C] to 90[[°C] . Several kinds of metals are used as electrode, such as, Al, Ag and Cu.From the experimental results, it is conclused that the conduction mechanism at highelectric field is SCLC. The dependences of temperature and kinds of metal on the trap filled electric field level can be well explained by this theory. |