| Title |
Lifetime-Temperature Rise Model for the Evaluation of Degradation in Electric Connections/Contacts |
| Authors |
김정태(Kim, Jeong-Tae) ; 김남준(Kim, Nam-Jun) |
| Keywords |
electric connections/contacts ; lifetime ; temperature-rise ; contact resistance ; thermal image camera |
| Abstract |
In this paper, 'lifetime-temperature rise model' based on the 'lifetime-resistance model' is theoretically Proposed, in order to find out the evaluation method of degradation and the residual lifetime by use of infrared image camera for electric connections/contacts. Two assumptions have been builded up for the 'lifetime-temperature rise model': one is associated with the linear relationship between the temperature ism ΔK and contact resistance, and the other the functional relationship between the temperature of electric connections/contacts and the operating time presenting in the 'lifetime-resistance model'. To prove the proposed model, experiments have been performed for various electric connections/contacts. From the experimental results, measured values were quite similar to the calculated values, which proved the above-mentioned two assumptions. Therefore, by use of 'lifetime-temperature rise model', it is possible to estimate the trend of degradation and the residual lifetime for electric connections/contacts through the temperature measurements . |