| Title |
Surface Plasmon Resonance Multisensing Using Thickness Difference of Additional Layer |
| Authors |
김영규(Kim, Young-Gyu) ; 오명환(Oh, Myung-Hwan) ; 이승기(Lee, Seung-Ki) |
| Keywords |
부가층 Surface Plasmon Resonance ; Multisensing |
| Abstract |
A novel surface plasmon resonance(SPR) multisensing method, which does not require imaging apparatus such as CCD, has been proposed and implemented experimentally. The proposed method is based on the multichannel SPR and the separation of signals by use of additional layers whose thickness is controlled. SPR signals are influenced by the thickness of sensing layer as well as the optical condition of sensing surface. As the SPR signals from different ligands are usually positioned closely, the reflected light from sensing surface does not provide us with the clear differences of resonance signal depending on the kinds of ligands. It was found from our experiments that SPR signals from each ligand that is located on the additional layer with different thickness can be separated clearly enough to identify various signals from different ligands. Proposed method with theoretical design and simulation has been verified experimentally by using SiO_2 thin film layer as additional layer. |