KIEE - The Transactions of the Korean Institute of Electrical Engineers

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The Transactions of the Korean Institute of Electrical Engineers

The Transactions of the Korean Institute of Electrical Engineers

ISO Journal TitleTrans. Korean. Inst. Elect. Eng.

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Title	The Study of Transient Radiation Effects on Commercial Electronic Devices
Authors	오승찬(Oh, Seugn-Chan) ; 이남호(Lee, Nam-Ho) ; 이흥호(Lee, Heung-Ho)
DOI	https://doi.org/10.5370/KIEE.2012.61.10.1448
Page	pp.1448-1453
ISSN	1975-8359
Keywords	Pulsed gamma-ray ; Transient radiation effect ; Total ionizing dose effect
Abstract	In this study, we carried out transient radiation test for identify failure situation by a transient radiation effect on operational amplifier devices. This experiments were carried out using a 60 MeV electron beam pulse of the LINAC(Linear Accelerator) facility in the Pohang Accelerator Laboratory. In this test, we has found that a serious failure as a burn-out effect due to overcurrent on the partial electronic devices.

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