| Title |
The Study of Radiation Hardened Common Sensor Circuits using COTS Semiconductor Devices for the Nuclear Power Plant |
| Authors |
김종열(Kim, Jong-Yeol) ; 이남호(Lee, Nam-Ho) ; 정현규(Jung, Hyun-Kyu) ; 오승찬(Oh, Seung-Chan) |
| DOI |
https://doi.org/10.5370/KIEE.2014.63.9.1248 |
| Keywords |
Radiation hardened ; Total ionizing dose effects ; Nuclear power plant |
| Abstract |
In this study, we designed a signal processing module using a radiation hardened technology that can be applied to the all measurement sensors inside nuclear power plant containment. Also, for verification that it can be used for high-level radiation environment (Harsh environmental zone inside containment of NPP), we carried out evaluation tests for a designed module using a Co^{60} gamma-ray source up to 12 kGy(Si). And, we had checked radiation hardening level that it has been satisfied up to 12 kGy(Si). |