KIEE - The Transactions of the Korean Institute of Electrical Engineers

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The Transactions of the Korean Institute of Electrical Engineers

The Transactions of the Korean Institute of Electrical Engineers

ISO Journal TitleTrans. Korean. Inst. Elect. Eng.

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Title	The Study on the SPICE Model Parameter Extraction Method for the Schottky Diode Under DC Forward Bias
Authors	이은구(Lee, Un-Gu)
DOI	https://doi.org/10.5370/KIEE.2016.65.3.439
Page	pp.439-444
ISSN	1975-8359
Keywords	Schottky diode ; SPICE model parameter ; Levenberg-Marquardt analysis ; Parameter extraction
Abstract	The method for extracting the SPICE model parameter of Schottky diode under DC forward bias is proposed. A method for improving the accuracy of the SPICE model parameter at various temperatures is proposed. Three analysis steps according to the magnitude of the current is used in order to extract the parameters effectively. At each analysis step, initial parameters are calculated by using the current-voltage equations and the Levenberg-Marquardt analysis is proceeded. To verify the validity of the proposed method, the SPICE model parameters for the BAT45 and FSV1045 under DC forward bias is extracted. Schottky diode currents obtained from the proposed method shows the average relative error of 6.1% and 9% compared with the measured data for the BAT45 and FSV1045 sample at various temperatures.

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