| Title |
A study on risk impact according to the electrical characteristics by hierarchy of the photovoltaic system |
| Authors |
채동주(Dong-Ju Chae) ; 이기연(Ki-Yeon Lee) ; 임승택(Seung-Taek Lim) |
| DOI |
https://doi.org/10.5370/KIEE.2022.71.3.548 |
| Keywords |
Direct current leakage current; Alternative current leakage current; Parasitic parallel resistance; Stray capacitance |
| Abstract |
The photovoltaic(PV) system is a representative renewable energy source, and the share of power generation is increasing. The power generation is based on the power converter for linking with commertial power system. So the DC and the AC coexist in the PV system. In the DC section, the DC leakage current was measured and it can be caused by the parallel resistance among the parasitic resistances that occur due to the limitation of uniform doping of the PN junction of the semiconductor. And it is directly affected by the irradiation. In the AC section, the AC leakage current was measured and it can be caused by the leakage path through the stray capacitance. And it is affected by the output power and the module temperature which limits to increase the output power and AC leakage current. Based on these electrical characteristics, the risk was demonstrated in the 50 kW PV system. |