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The Transactions of
the Korean Institute of Electrical Engineers
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Trans. Korean. Inst. Elect. Eng.
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2019-04
(Vol.68 No.04)
10.5370/KIEE.2019.68.4.553
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References
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Tony nilsson, Rolf jasson, Nov 2005, Investigation of HPM front- door protection devices and component susceptibility, The. Swedish Defense Research Agency (FOI) Technical Report
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S. M. Hwang, C. S. Huh, Sep 2015, The Susceptibility of LNA(Low Noise Amplifier) Due To Front-Door Coupling Under Narrow-Band High Power Electromagnetic Wave, Journal of IKEEE, Vol. 19, No. 3, pp. 440-446
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M. Camp, H. Garbe, D. Nitsch, 2002, Influence of the Technology on the Destruction Effects of Semi- conductors by Impact of EMP and UWB Pulses, IEEE International Symposium on Electromagnetic Com- patibility, Vol. 1, pp. 87-92
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M. Camp, H. Garbe, 2003, Influence of Operation and Program States on the Breakdown Effects of Electronics by Impact of EMP and UWB, IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, pp. 1032-1035
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Kyechong Kim, 2007, Critical Upsets of CMOS Inverters in Static Operation Due to High-Power Microwave Interference, IEEE Trans. on EMC, Vol. 49, No. 4
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S. M. Hwang, J. I. Hong, C. S. Huh, Sep 2007, The Destruction Effects of Semiconductors by High Power Electro- magnetic Wave, The transactions of The KIEE, Vol. 56, No. 9, pp. 1638-1642
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S. Korte, M. Camp, H. Garbe, 2005, Hardware and Software Simulation of Transient Pulse Impact on Integrated Circuits, IEEE International Symposium on Electro- magnetic Compatibility, Vol. 2, pp. 489-494
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D. Nitsch, M. Camp, F. Sabath, J.L. ter Haseborg, H. Garbe, Aug 2004, Susceptibility of Some Electronic Equipment to HPEM Threats, IEEE Transactions on Electromagnetic Compatibility, Vol. 46, No. 3, pp. 380-389