KIEE
The Transactions of
the Korean Institute of Electrical Engineers
KIEE
Contact
Open Access
Monthly
ISSN : 1975-8359 (Print)
ISSN : 2287-4364 (Online)
http://www.tkiee.org/kiee
Mobile QR Code
The Transactions of the Korean Institute of Electrical Engineers
ISO Journal Title
Trans. Korean. Inst. Elect. Eng.
Main Menu
Main Menu
최근호
Current Issue
저널소개
About Journal
논문집
Journal Archive
편집위원회
Editorial Board
윤리강령
Ethics Code
논문투고안내
Instructions to Authors
연락처
Contact Info
논문투고·심사
Submission & Review
Journal Search
Home
Archive
2019-11
(Vol.68 No.11)
10.5370/KIEE.2019.68.11.1338
Journal XML
XML
PDF
INFO
REF
References
1
S. M. Hwang, J. I. Hong, C. S. Huh, 2007, The Destruction Effects of Semiconductors by High Power Electromagnetic Wave, The Transactions of The Korean Institute of Electrical Engineers, Vol. 56, No. 9, pp. 1638-1642
2
R. Hoad, A. Lambourne, A. Wraight, 2006, HPEM and HEMP Susceptibility Assessments of Computer Equipment, in Proc. of 17th International Zurich Symposium on Electro-magnetic Compatibility, pp. 168-171
3
W. A. Radasky, C. E. Baum, M. W. Wik, 2004, Introduction to the special issue on high-power electromagnetics (HPEM) and intentional electromagnetic interference (IEMI), IEEE Trans. on EMC, Vol. 46, No. 3, pp. 314-321
4
M. W. Wik, W. A. Radasky, 2004, Development of High- power Electromagnetic (HPEM) Standards, IEEE Trans. on EMC, Vol. 46, No. 3, pp. 439-445
5
이름 T. Weber, 이름 R. Krzikalla, 이름 J. Luiken ter Haseborg, 2005, Linear and nonlinear filters suppressing UWB Pulses, IEEE Trans. on EMC, Vol. 47, No. 3, pp. 671-672
6
Tony Nilsson, Rolf Jasson, 2005, Investigation of HPM front-door protection devices and component susceptibility, The. Swedish Defense Research Agency (FOI)
7
Kai Zhang, Donglin Su, Yi Liao, Yan Liu, Yong Li, 2012, Fast EMP response calculation of dipole antennas based on equivalent circuit, ISAPE2012, pp. 1147-1149
8
M. Camp, H. Garbe, D. Nitsch, 2002, Influence of the Technology on the Destruction Effects of Semiconductors by Impact of EMP and UWB Pulses, in Proc. of IEEE International Symposium on Electromagnetic Compatibility, Vol. 1, pp. 87-92
9
M. Camp, H. Garbe, 2003, Influence of Operation- and Program-States on the Breakdown Effects of Electronics by Impact of EMP and UWB, in Proc. of IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, pp. 1032-1035