J. Li, Z. Shen, X. Chen, S. Yang, W. Zhou, M. Wang, L. Wang, Q. Kou, Y. Liu, Q. Li, Z. Xu, Y. Chang, S. Zhang, F. Li, 2020, Grain-orientation-engineered multilayer ceramic capacitors for energy storage applications, Nat. Mater., Vol. 19, pp. 999-1005

J.-R. Yoon, M. K. Kim, 2020, Electrical characteristics of multilayered ceramic capacitors depending on BaTiO particle size, J. Electr. Eng. Technol., Vol. 15, pp. 2685-2690

K. Hong, T. H. Lee, J. M. Suh, S.-H. Yoon, H. W. Jang, 2019, Perspectives and challenges in multilayer ceramic capacitors for next generation electronics, J. Mater. Chem. C, Vol. 7, pp. 9782-9802

S. Levikari, T. J. Karkkainen, C. Andersson, J. Tammminen, P. Silventoinen, 2019, Acoustic detection of cracks and dela- mination in multilayer ceramic capacitors, IEEE Trans. Ind. Appl., Vol. 55, No. 2, pp. 1787-1794

A. M. Hernandez-Lopez, J. A Aguilar-Garib, S. Guillemet- Fritsch, R. Nava-Quitero, P. Dufour, C. Tenailleau, B. Durand, Z. Valdez-Nava, 2018, Reliability of X7R multilayer ceramic capacitors during high accelerated life testing (HALT), Materials, Vol. 11, pp. 1900

H. Wang, F. Blaabjerg, 2014, Reliability of capacitors for DC-link applications in power electronic converters-an overview, IEEE Trans. Ind. Appl., Vol. 50, pp. 3569-3578

CS5750X7R474K63, Samhwa Capacitor Co. Ltd

C225C474KBRAC7800, KEMET Co

T. Tsurumi, M. Shono, H. Kakemoto, S. Wada, K. Saito, H. Chazono, 2005, Mechanisms of capacitance aging under DC electric fields in multilayer ceramic capacitors with X7R characteristics, Jpn. J. Appl. Phys., Vol. 44, No. 9B, pp. 6989-6994

T. Tsurumi, M. Shono, H. Kakemoto, S. Wada, K. Saito, H. Chazono, 2008, Mechanism of capacitance aging under DC-bias field in X7R-MLCCs, J. Electroceram, Vol. 21, pp. 17-21

D. W. Hahn, Y. H. Han, 2009, Capacitance aging behavior of acceptor-doped BaTiO under DC electrical field, J. Korean Ceram. Soc., Vol. 46, No. 2, pp. 219-1233

D. A. Neamen, 2003, Semiconductor physics and devices, 2nd Edition, McGraw-Hill