X. Li, X. Tong, R. Hu, Y. Wen, H. Zhu, X. Deng, Y. Sun, W. Chen, S. Bai, B. Zhang,
January 2021, Failure Mechanism of Avalanche Condition for 1200-V Double Trench SiC
MOSFET, IEEE Journal of Emerging and Selected Topics in Power Electronics, Vol. 9,
No. 2, pp. 2147-2154
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