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References

1 
Oct. 2020, Moore’s law slowing down, Slide of Marvell Investor DayGoogle Search
2 
2020, Test costs rise as process nodes shrink, Technical Brief of Cadence Modus DFT Software SolutionGoogle Search
3 
L.-T. Wang, C.-W. Wu, X. Wen, 2006, VLSI Test Principles and Architectures: Design for Testability, Morgan Kaufmann Series in Systems on SiliconGoogle Search
4 
B S. K. Reddy, B. Papachari, G. Pravallika, K. Panduga, Dec 2022, Design and Implementation of Novel FPGA Based LFSR for IOT and Smart Applications, Proc. of IEEE WIECON- ECEDOI
5 
S. H. Wu, 2008, Antirandom Testing: A Distance-Based Approach, VLSI Design, Vol. 2008, pp. 1-9Google Search
6 
T. Chen, A. Bai, A. Hajjar, A.K.A. Andrews, C. Anderson, 2002, Fast Anti-Random(FAR) Test Generation to Improve the Quality of Behavioral Model Verification, Journal of Electronic Testing, Vol. 18, pp. 583-594DOI
7 
T. Y. Chen, F.-C. Kuo, R. G. Merkel, T. H. Tse, Jan 2010, Adaptive Random Testing: The ART of test case diversity, Journal of Systems and Software, Vol. 83, No. 1, pp. 60–66DOI
8 
D.B.Y. Yiunn, A.K.B. A’ain, Khor, J. Ghee, 2010, Scalable test pattern generation(STPG), Proc. IEEE Symp. on Industrial Electronics & Applications(ISIEA)Google Search
9 
M. S. Sahari, A. K. A’ain, I. A. Grout, Mar 2015, Scalable antirandom testing(SAT), International Journal of Innovative Science and Modern Engineering, Vol. 3Google Search
10 
I. Mrozek, V. N. Yarmolik, Jun 2012, Iterative antirandom testing, Journal of Electronic Testing, Vol. 28DOI
11 
I. Mrozek, V. Yarmolik, 2016, Methods of synthesis of controlled random tests, Proc. IFIP International Conference on Computer Information Systems and Industrial ManagementDOI
12 
A. Alamgir, 2019, Multiple Controlled Antirandom Testing(MCAT) for High Fault Coverage in a Black Box Environment, IEEE AccessDOI
13 
A. Alamgir, 2018, Horizontal diversity in test generation for high fault coverage, Turkish Journal of Electrical Engineering and Computer Sciences, Vol. 26DOI
14 
Atalanta v. 2.0, https://github.com/hsluoyz/AtalantaGoogle Search