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Trans. Korean. Inst. Elect. Eng.
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2023-02
(Vol.72 No.02)
10.5370/KIEE.2023.72.2.207
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References
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B. J. Baliga, 2019, Synopsys, in Wide Bandgap Semiconductor Power Devices: Elsevier, pp. 373-388
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Jiaxing Wei, 2017, Interfacial Damage Extraction Method for SiC Power MOSFETs Based on C-V Characteristics, IEEE, pp. 359